NEN - NPR-IEC/PAS 62396-2
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for the single event effects testing for avionics systems
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 November 2007 |
| Status: | inactive |
| Page Count: | 33 |
| ICS Code (Production. Production management): | 03.100.50 |
| ICS Code (Electronic components in general): | 31.020 |
scope:
The purpose of this PAS is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
Document History
NPR-IEC/PAS 62396-2
November 1, 2007
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for the single event effects testing for avionics systems
The purpose of this PAS is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the...