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NEN 10596

Test methods for semiconductor radiation detectors and scintillation counting - Definitions

inactive, Most Current
Organization: NEN
Publication Date: 1 February 1981
Status: inactive
ICS Code (Radiation measurements): 17.240
scope:

To define those terms necessary for a good understanding of the publications IEC 333, IEC 430 and IEC 462

Document History

NEN 10596
February 1, 1981
Test methods for semiconductor radiation detectors and scintillation counting - Definitions
To define those terms necessary for a good understanding of the publications IEC 333, IEC 430 and IEC 462
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