NEN 10596
Test methods for semiconductor radiation detectors and scintillation counting - Definitions
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 1981 |
| Status: | inactive |
| ICS Code (Radiation measurements): | 17.240 |
scope:
To define those terms necessary for a good understanding of the publications IEC 333, IEC 430 and IEC 462
Document History
NEN 10596
February 1, 1981
Test methods for semiconductor radiation detectors and scintillation counting - Definitions
To define those terms necessary for a good understanding of the publications IEC 333, IEC 430 and IEC 462