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NEN-EN-IEC 60679-4

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval

active, Most Current
Organization: NEN
Publication Date: 1 May 1998
Status: active
Page Count: 76
ICS Code (Piezoelectric devices): 31.140
scope:

Applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It describes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification, IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators. The concept of preferred values is directly to standard cataloque items but does not necessarily apply to custom built products. Specifies the terminology and test methods for declaring the c haracteristics of positron emission tomographs. Positron emission tomopgraphs detect the annihilation radiation of positron emission radionuclides by coincidence detection.

Document History

NEN-EN-IEC 60679-4
May 1, 1998
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
Applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It describes the preferred...
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