NEN-IEC 60748-4-3
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2006 |
| Status: | active |
| Page Count: | 44 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
Document History
NEN-IEC 60748-4-3
September 1, 2006
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.