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NEN-EN-IEC 60444-1

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

active
Organization: NEN
Publication Date: 1 August 1997
Status: active
Page Count: 50
ICS Code (Piezoelectric devices): 31.140
scope:

This standard specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network. The measuring method and the network are suitable for use over the frequency range 1 MHz to 200 MHz with a fractional frequency accuracy of the order of 10-6 with a reproducibility of 10-8 depending on the type of crystal unit being measured, and an accuracy of the measurement of resonance resistance of ± 2% to ± 5% depending on the accuracy of the voltage measurement. However, above approximately 100 MHz the use of this measuring method is limited by the effects of the shunt capacitance C90 of the crystal unit under test. To enable the measuring method to be used under these conditions, the use of some method of C0 compensation is advisable.

Document History

November 1, 1999
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
A description is not available for this item.
NEN-EN-IEC 60444-1
August 1, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
This standard specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network. The measuring method and the...
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