NEN-EN-IEC 60749-11
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature two fluid baths method
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Defines the rapid change of temperature test methods and the two-fluid-bath method. When both test methods are performed as part of a device qualification, results of air to air temperature cycling take priority over this two-fluid-bath test method.
Document History
NEN-EN-IEC 60749-11
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature two fluid baths method
Defines the rapid change of temperature test methods and the two-fluid-bath method. When both test methods are performed as part of a device qualification, results of air to air temperature cycling...