NEN-IEC 61163-2
Reliability stress screening - Part 2: Electronic components
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 December 1998 |
| Status: | inactive |
| Page Count: | 80 |
| ICS Code (Electronic components in general): | 31.020 |
| ICS Code (Quality in general): | 03.120.01 |
scope:
Provides guidance on reliability stress screening techniques and procedures for electronic components. This standard is not, and cannot be, exhaustive due to the rapid rate of developments in the electronics industry.
Document History
NEN-IEC 61163-2
December 1, 1998
Reliability stress screening - Part 2: Electronic components
Provides guidance on reliability stress screening techniques and procedures for electronic components. This standard is not, and cannot be, exhaustive due to the rapid rate of developments in the...