NEN-EN-IEC 61967-1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2002 |
| Status: | active |
| Page Count: | 62 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included as annex A to assist in selecting the appropriate measurement method(s).
Document History
NEN-EN-IEC 61967-1
August 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions,...