NEN - NPR-IEC/PAS 62202
Failure mechanisms and models for silicon semiconductor devices
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 February 2001 |
| Status: | inactive |
| Page Count: | 46 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations whens the only available data is based on tests performed at accelerated stress test conditions. The method to be used in the Sum-of-the-Failure-R
Document History
NPR-IEC/PAS 62202
February 1, 2001
Failure mechanisms and models for silicon semiconductor devices
Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations whens the only available data is...