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NEN - NPR-IEC/TS 62228

Integrated circuits - EMC evaluation of CAN transceivers

active, Most Current
Organization: NEN
Publication Date: 1 March 2007
Status: active
Page Count: 50
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This document specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - the immunity against RF common mode disturbances on the signal lines, - the emissions caused by non-symmetrical signals regarding the time and frequency domain, - the immunity against transients (function and damage), and - the immunity against electrostatic discharges - ESD (damage). All measurements and functional tests except ESD are performed in a small (three transceiver) network. For ESD damage tests a single transceiver configuration on a special test board is used. External protection circuits are not applied during the tests in order to get results for the transceiver IC only.

Document History

NPR-IEC/TS 62228
March 1, 2007
Integrated circuits - EMC evaluation of CAN transceivers
This document specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - the...
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