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CEI EN 62884-2

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 2: Phase jitter measurement method

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Organization: CEI
Publication Date: 1 April 2018
Status: active
Page Count: 34
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration

Document History

CEI EN 62884-2
April 1, 2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 2: Phase jitter measurement method
This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric...

References

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