Terminology Relating to Measurements Taken on Thin, Reflecting Films
|Publication Date:||15 October 2011|
|ICS Code (Mechanical structures for electronic equipment):||31.240|
|ICS Code (Electronics (Vocabularies)):||01.040.31|
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanic
The terms are listed in alphabetical order.
This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.