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ASTM E2444

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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Organization: ASTM
Publication Date: 15 October 2011
Status: active
Page Count: 2
ICS Code (Mechanical structures for electronic equipment): 31.240
ICS Code (Electronics (Vocabularies)): 01.040.31
scope:

This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

The terms are listed in alphabetical order.

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Document History

ASTM E2444
October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
October 15, 2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
May 1, 2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...
May 1, 2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms...

References

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