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ISO DIS 20171

Microbeam analysis - Scanning electron microscopy - Tagged image file format for Scanning electron microscopy(TIFF/SEM)

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Organization: ISO
Publication Date: 30 May 2018
Status: active
Page Count: 44
ICS Code (Optical equipment): 37.020
ICS Code (IT applications in science): 35.240.70
scope:

This International Standard specifies the data file format of digital images generated by a scanning electron microscope (SEM) by adapting the TIFF based format. The data file includes not only the image data but the SEM conditional information defined in this format. This standard does not address the security of the data file.

Document History

ISO DIS 20171
May 30, 2018
Microbeam analysis - Scanning electron microscopy - Tagged image file format for Scanning electron microscopy(TIFF/SEM)
This International Standard specifies the data file format of digital images generated by a scanning electron microscope (SEM) by adapting the TIFF based format. The data file includes not only the...

References

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