AFNOR - NF EN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 23 March 2018 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN IEC 60749-26
March 23, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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