IEEE P1505.1 DRAFT

The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

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Organization: IEEE
Publication Date: 1 July 2018
Status: active
Page Count: 157
scope:

The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ Receiver Fixture Interface (RFI). The pin map defined within this standard shall apply to military and Aerospace Automatic Test Equipment (ATE) testing applications.

Purpose

Permits the physical interoperability of IEEE-1505 compliant interface fixtures [also known as interface test adapters, interface devices, or interconnecting devices on multiple ATE systems utilizing the IEEE 1505 Receiver Fixture Interface by providing a standardized physical pin map with related connector configuration and contact performance characteristics.

Document History

IEEE P1505.1 DRAFT
July 1, 2018
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ Receiver Fixture Interface (RFI). The pin map defined within this standard shall apply to military and...
December 1, 2015
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...
September 26, 2008
Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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References

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