IEEE P1505.1 DRAFT
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
|Publication Date:||1 July 2018|
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505™ Receiver Fixture Interface (RFI). The pin map defined within this standard shall apply to military and Aerospace Automatic Test Equipment (ATE) testing applications.
Permits the physical interoperability of IEEE-1505 compliant interface fixtures [also known as interface test adapters, interface devices, or interconnecting devices on multiple ATE systems utilizing the IEEE 1505 Receiver Fixture Interface by providing a standardized physical pin map with related connector configuration and contact performance characteristics.