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JEDEC JEP 155

Recommended ESD Target Level for HBM Qualification

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Organization: JEDEC
Publication Date: 1 July 2018
Status: active
Page Count: 58
scope:

The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to quality organizations in both semiconductor companies and their IC customers.

Special Notes on the System Level ESD:

This work and the recommendations therein are intended for Component Level safe ESD requirements and will have little or no effect on system level ESD results.

Systems and System boards should continue to be designed to meet appropriate ESD threats regardless of the components in the systems that are meeting the new recommendations from this work, and that all proper system reliability must be assessed through the IEC test method.

Special Notes on the Machine Model:

The machine model (MM) method as specified by some customers and suppliers is not a qualification methodology by JEDEC for use in place of or in addition to HBM and CDM test qualification.

Document History

JEDEC JEP 155
July 1, 2018
Recommended ESD Target Level for HBM Qualification
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
March 1, 2012
Recommended ESD Target Levels for HBM/MM Qualification
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
January 1, 2012
Recommended ESD Target Levels for HBM/MM Qualification
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
August 1, 2008
Recommended ESD Target Levels for HBM/MM Qualification
This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD level...

References

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