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BSI - 18/30361563 DC

Draft BS EN 62433 EMC IC modelling Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)

pending, Most Current
Organization: BSI
Publication Date: 20 July 2018
Status: pending
Page Count: 45
ICS Code (Integrated circuits. Microelectronics): 31.200
ICS Code (Emission): 33.100.10

Document History

18/30361563 DC
July 20, 2018
Draft BS EN 62433 EMC IC modelling Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI)
A description is not available for this item.

References

This document references:
ANSI INCITS 4 - Information Systems - Coded Character Sets - 7-Bit American National Standard Code for Information Interchange (7-Bit ASCII)
Published by ANSI on January 1, 1986
Scope and Field of Application This standard specifies a set of 128 characters (control characters and graphic characters, such as letters, digits, and symbols) with their coded representation. The...
This document references:
IEC 61000-4-2 - Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement techniques – Electrostatic discharge immunity test
Published by IEC on December 1, 2008
This International Standard relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and to...
This document references:
IEC 62215-3 - Integrated circuits – Measurement of impulse immunity – Part 3: Non-synchronous transient injection method
Published by IEC on July 1, 2013
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily...
This document references:
IEC 62433-3 - EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
Published by IEC on January 1, 2017
This part of IEC 62433 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated...
This document references:
IEC 62433-4 - EMC IC modelling – Part 4: Models of integrated circuits for RF immunity behavioural simulation – Conducted immunity modelling (ICIM-CI)
Published by IEC on May 1, 2016
This part of IEC 62433 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated...
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