UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

JEDEC JESD 89

Test Method for Beam Accelerated Soft Error Rate

active, Most Current
Buy Now
Organization: JEDEC
Publication Date: 1 November 2007
Status: active
Page Count: 28
scope:

This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

Document History

JEDEC JESD 89
November 1, 2007
Test Method for Beam Accelerated Soft Error Rate
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error...
October 1, 2007
Test Method for Alpha Source Accelerated Soft Error Rate
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g....
October 1, 2007
Test Method for Real-Time Soft Error Rate
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or...
October 1, 2006
Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and...
September 1, 2005
Test Method for Beam Accelerated Soft Error Rate
A description is not available for this item.
November 1, 2004
Test Method For Alpha Source Accelerated Soft Error Rate
A description is not available for this item.
June 1, 2004
System Soft Error Rate (SSER) Test Method
A description is not available for this item.
July 1, 2001
Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
A description is not available for this item.

References

Advertisement