TSE - TS EN 12543-2
Non-destructive testing ? Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing ? Part 2: Pinhole camera radiographic method
inactive
| Organization: | TSE |
| Publication Date: | 20 April 2004 |
| Status: | inactive |
| ICS Code (Non-destructive testing): | 19.100 |
scope:
Bu standard, odak noktasi boyutlari 0,2 mm?den buyuk, 500 kV?akadar ve 500kV?u kapsayan tup gerilimine sahip X-isinisistemlerinin
Document History
January 7, 2015
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method
Bu standard, odak noktasi boyutlari 0,2 mm?den buyuk, 500 kV?akadar ve 500kV?i kapsayan tup gerilimine sahip X-isinisistemlerinin, nokta delikli kamera vasitasiyla, odak noktasiboyutlarinin olculmesi...
April 9, 2009
Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method
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TS EN 12543-2
April 20, 2004
Non-destructive testing ? Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing ? Part 2: Pinhole camera radiographic method
Bu standard, odak noktasi boyutlari 0,2 mm?den buyuk, 500 kV?akadar ve 500kV?u kapsayan tup gerilimine sahip X-isinisistemlerinin, nokta delikli kamera vasitasiyla, odak noktasiboyutlarinin olculmesi...