UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

TSE - TS 2552

Essential Ratings and Characteristics of Semiconductor Devices and General Principles of Measuring Methods Part 2: General Principles of Measuring Methods

inactive, Most Current
Organization: TSE
Publication Date: 17 February 1977
Status: inactive
ICS Code (Semiconductor devices in general): 31.080.01
scope:

Bu standard, yari iletken elemanlarin olcme metotlarinin genelilkelerini kapsar. Bu standard, belirli eleman parametrelerininolculmesi icin gunumuz pratigine dayanan bilgileri verir. Burada TS2551 de siralanan parametrelerin olculmesine dair metotlartanitilmis ve ileride benzer parametreleri de kapsamasiongorulmustur. Herhangi bir......

Document History

TS 2552
February 17, 1977
Essential Ratings and Characteristics of Semiconductor Devices and General Principles of Measuring Methods Part 2: General Principles of Measuring Methods
Bu standard, yari iletken elemanlarin olcme metotlarinin genelilkelerini kapsar. Bu standard, belirli eleman parametrelerininolculmesi icin gunumuz pratigine dayanan bilgileri verir. Burada TS2551 de...
Advertisement