UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

TSE - TS EN 12543-3

Non-destructive testing ? Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing ? Part 3: Slit camera radiographic method

active, Most Current
Organization: TSE
Publication Date: 16 March 2004
Status: active
ICS Code (Non-destructive testing): 19.100
scope:

Bu standard, odak noktasi boyutlari 0.1 mm?den buyuk, 500 kV?yekadar ve 500kV?yi kapsayan tup gerilimine sahip X-isinisistemlerinin, ince yarikli kamera vasitasiyla odak noktasiboyutlarinin olculmesi icin bir metot tanimlar. Bu olcme icinkullanilan tup gerilimi 200kv ile sinirlandirilmistir. X-isinigoruntulerinin goruntu kalitesi ve cozunurlugu, yuksek oranda odaknoktasinin ozelliklerine; bilhassa odak noktasinin boyutuna venesne duzlemindeki iki boyutlu siddet dagilimina baglidir. TicariX-isini tuplerinin tanimlanmasi icin (mesela reklam ve ticareticin) Ek A?da verilen ozel azami degerler tercih edilmelidir.

Document History

TS EN 12543-3
March 16, 2004
Non-destructive testing ? Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing ? Part 3: Slit camera radiographic method
Bu standard, odak noktasi boyutlari 0.1 mm?den buyuk, 500 kV?yekadar ve 500kV?yi kapsayan tup gerilimine sahip X-isinisistemlerinin, ince yarikli kamera vasitasiyla odak noktasiboyutlarinin olculmesi...
Advertisement