UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

TSE - TS EN 60444-4

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network-Part 4:Method for the measurement of the load resonance frequency <(kursiv)f><(Index)L>, load resonance resistance <(kursiv)R><(Index)L>and the calculation of other derived values of quartz crystal units, up to 30 MHz

active, Most Current
Organization: TSE
Publication Date: 4 November 1997
Status: active
ICS Code (Piezoelectric devices): 31.140

Document History

TS EN 60444-4
November 4, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network-Part 4:Method for the measurement of the load resonance frequency <(kursiv)f><(Index)L>, load resonance resistance <(kursiv)R><(Index)L>and the calculation of other derived values of quartz crystal units, up to 30 MHz
A description is not available for this item.
Advertisement