TSE - TS EN 60749-7
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
inactive
| Organization: | TSE |
| Publication Date: | 28 April 2004 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Bu standard, sikica contalanmis metal veya seramik bir cihazicindeki atmosferde bulunan su buhari ve diger gazlarinmuhtevasinin
Document History
February 21, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
A description is not available for this item.
TS EN 60749-7
April 28, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Bu standard, sikica contalanmis metal veya seramik bir cihazicindeki atmosferde bulunan su buhari ve diger gazlarinmuhtevasinin olculmesini ve deneye t?bi tutulmasini kapsar.
November 11, 2002
IEC 60749-7, Ed. 1: Semiconductor devices - Mechanical and climatic test method - Part 7: Internal moisture content measurement and the analysis of other residual gases
Bu standard, kısa mesafeli cihazlar (SRD'ler) sınıfındaki 9 kHz-25 Mhz frekans aralığında çalışan vericileri, 9 kHz-30 MHz frekans aralığında çalışan alıcıları kapsar.