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BSI - BS DD IEC/PAS 62396-2

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

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Organization: BSI
Publication Date: 31 December 2007
Status: inactive
Page Count: 24
ICS Code (Production. Production management): 03.100.50
ICS Code (Aerospace electric equipment and systems): 49.060

Document History

BS IEC 62396-2
January 31, 2018
Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.
BS IEC 62396-2
August 31, 2014
Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.
BS DD IEC/TS 62396-2
October 31, 2008
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.
BS DD IEC/PAS 62396-2
December 31, 2007
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.

References

This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
JEDEC JESD 57 - Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Published by JEDEC on December 1, 1996
This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when...
This document references:
JEDEC JESD 89 - Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
Published by JEDEC on October 1, 2006
This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and...
This document references:
BS IEC 62396-1 - Process management for avionics - Atmospheric radiation effects Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by BSI on January 31, 2016
A description is not available for this item.
This document references:
IEC 62396-1 - Process management for avionics – Atmospheric radiation effects – Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by IEC on January 1, 2016
This part of IEC 62396 is intended to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the...
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