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IEC 60749-37

Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer

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Organization: IEC
Publication Date: 1 January 2008
Status: active
Page Count: 44
ICS Code (Semiconductor devices in general): 31.080.01

Document History

IEC 60749-37
January 1, 2008
Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer
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