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IEC - 60749-38

Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory

active, Most Current
Organization: IEC
Publication Date: 1 February 2008
Status: active
Page Count: 30
ICS Code (Semiconductor devices in general): 31.080.01

Document History

60749-38
February 1, 2008
Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory
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References

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