IEC/PAS 60679-6
Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide
inactive
Buy Now
| Organization: | IEC |
| Publication Date: | 1 February 2008 |
| Status: | inactive |
| Page Count: | 24 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
March 1, 2011
Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows...
IEC/PAS 60679-6
February 1, 2008
Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide
A description is not available for this item.