DIN IEC 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 47/1961/CD:2008)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 May 2008 |
| Status: | inactive |
| Page Count: | 28 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 62047-8
May 1, 2008
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 47/1961/CD:2008)
A description is not available for this item.