AFNOR - NF EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 January 2008 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 62374
January 1, 2008
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
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