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ASTM F1262M

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

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Organization: ASTM
Publication Date: 10 November 1995
Status: inactive
Page Count: 5
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

June 1, 2014
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy...
ASTM F1262M
November 10, 1995
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s....
November 10, 1995
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (Si)/s....
January 1, 1995
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
1. Scope 1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103...

References

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