AFNOR - NF EN 61967-6/A1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 June 2008 |
| Status: | active |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ICS Code (Emission): | 33.100.10 |
Document History
NF EN 61967-6/A1
June 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method
A description is not available for this item.
January 1, 2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method
A description is not available for this item.
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