Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
|Publication Date:||15 June 2008|
|ICS Code (Superconductivity and conducting materials):||29.050|
This test method determines the concentrations of trace metallic
impurities in high purity (99.99 wt. % pure, or purer, with respect
to metallic trace impurities) aluminum-copper, aluminum-silicon and
This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).
This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment, skillfully used by an experienced operator, is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of detection limits, etc.) known by the responsible technical committee to effect the reliability of high purity aluminum analyses.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.