UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-97597

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 27 June 1997
Status: inactive
Page Count: 22
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is be as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function Toggle Speed (Mhz) 01 7C372i 64 Macrocell CPLD 66 02 7C372i 64 Macrocell CPLD 83

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X GQCC1-J44 44 J leaded chip carrier

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range (VCC) --------------------------- −2.0 V dc to +7.0 V dc Programming supply voltage range (VPP) --------------- −2.0 V dc to +13.5 V dc 2/ DC input voltage range ------------------------------- −2.0 V dc to +7.0 V dc 2/ Maximum power dissipation ---------------------------- 2.5 W 3/ Lead temperature (soldering, 10 seconds) ------------- +260°C Thermal resistance, junction-to-case (θJC): Case outline X -------------------------------------- See MIL-STD-1835 Junction temperature (TJ) ---------------------------- +175°C 4/ Storage temperature range ---------------------------- −65°C to + 150°C Endurance -------------------------------------------- 25 erase/write cycles (minimum) Data retention --------------------------------------- 10 years (minimum)

Case operating temperature Range(TC) ----------------- −55°C to + 125°C Supply voltage relative to ground(VCC) --------------- +4.5 V dc minimum to +5.5 V dc maximum Ground voltage (GND) --------------------------------- 0 V dc Input high voltage (VIH) ----------------------------- 2.0 V dc minimum Input low voltage (VIL) ------------------------------ 0.8 V dc maximum

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012)---------- 6/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

September 19, 2017
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 5, 2008
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
May 20, 2002
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-97597
June 27, 1997
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
Advertisement