DIN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
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| Organization: | DIN |
| Publication Date: | 1 October 2008 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-38
October 1, 2008
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
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