CENELEC - EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 October 2007 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
EN 62374
October 1, 2007
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
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