ATIS T1.TR.25
Test Patterns for DS1 Circuits
| Organization: | ATIS |
| Publication Date: | 1 November 1993 |
| Status: | active |
| Page Count: | 29 |
scope:
This report provides insight and guidance on the use of a constellation of test signals covered by industry agreements on performing acceptance and maintenance testing of DS1 circuits. Information is also included on an increasingly popular signal that may be a candidate for inclusion in future industry agreements. Appendix A provides hexadecimal notation of the described test signals to facilitate their use in test equipment requiring hexadecimal input. Background material on other test signals, and other test objectives can be found in Appendix B to this report.
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