JSA - JIS C 5630-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
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| Organization: | JSA |
| Publication Date: | 20 March 2009 |
| Status: | active |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
JIS C 5630-3
March 20, 2009
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
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