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DLA - DSCC-VID-V62/04727

MICROCIRCUIT, DIGITAL, CMOS, DUAL 2:1 ANALOG MULTIPLEXER WITH IEEE 1149.4, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 22 November 2004
Status: inactive
Page Count: 12

Document History

DSCC-VID-V62/04727 REV A
September 15, 2016
MICROCIRCUIT, DIGITAL, CMOS, DUAL 2:1 ANALOG MULTIPLEXER WITH IEEE 1149.4, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance dual 2:1 analog multiplexer with IEEE 1149.4 microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/04727
November 22, 2004
MICROCIRCUIT, DIGITAL, CMOS, DUAL 2:1 ANALOG MULTIPLEXER WITH IEEE 1149.4, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
This document references:
IEEE 1149.4 - A Mixed-Signal Test Bus
Published by IEEE on December 9, 2010
This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital...
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