DIN IEC 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 47/2012/CD:2009)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 June 2009 |
| Status: | inactive |
| Page Count: | 43 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-40
June 1, 2009
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 47/2012/CD:2009)
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