JEDEC JEB 5
Methods of Measurement for Semiconductor Logic Gating Microcircuits
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| Organization: | JEDEC |
| Publication Date: | 1 January 1970 |
| Status: | active |
| Page Count: | 44 |
scope:
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.
Document History
JEDEC JEB 5
July 28, 1970
Methods of Measurement for Semiconductor Logic Gating Microcircuits
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and...
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