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ASTM F632

STANDARD TEST METHOD FOR MEASURING SMALL-SIGNAL COMMON EMITTER CURRENT GAIN OF TRANSISTORS AT HIGH FREQUENCIES

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Organization: ASTM
Publication Date: 31 October 1986
Status: inactive
Page Count: 6

Document History

February 23, 1990
STANDARD TEST METHOD FOR MEASURING SMALL-SIGNAL COMMON EMITTER CURRENT GAIN OF TRANSISTORS AT HIGH FREQUENCIES
A description is not available for this item.
ASTM F632
October 31, 1986
STANDARD TEST METHOD FOR MEASURING SMALL-SIGNAL COMMON EMITTER CURRENT GAIN OF TRANSISTORS AT HIGH FREQUENCIES
A description is not available for this item.
September 28, 1979
STANDARD METHOD FOR MEASURING SMALL-SIGNAL COMMON EMITTER CURRENT GAIN OF TRANSISTORS AT HIGH FREQUENCIES
A description is not available for this item.
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