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IEC 60891

Photovoltaic devices – Procedures for temperature and irradiance corrections to measured I-V characteristics

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Organization: IEC
Publication Date: 1 December 2009
Status: active
Page Count: 44
ICS Code (Solar energy engineering): 27.160
scope:

This standard defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the procedures used to determine factors relevant for these corrections. Requirements for I-V measurement of photovoltaic devices are laid down in IEC 60904-1.

NOTE 1 The photovoltaic devices include a single solar cell with or without a protective cover, a sub-assembly of solar cells, or a module. A different set of relevant parameters for I-V correction applies for each type of device. Although the determination of temperature coefficients for a module (or sub-assembly of cells) may be calculated from single cell measurements, it should be noted that the internal series resistance and curve correction factor should be separately measured for a module or subassembly of cells.

NOTE 2 The term "test specimen" is used to denote any of these devices.

NOTE 3 Care should be taken regarding the use of I-V correction parameters. The parameters are valid for the PV device for which they have been measured. Variations may occur within a production lot or the type class.

Document History

IEC 60891
December 1, 2009
Photovoltaic devices – Procedures for temperature and irradiance corrections to measured I-V characteristics
This standard defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the...
April 1, 1987
Procedures for Temperature and Irradiance Corrections to Measured I-V Characteristics of Crystalline Silicon Photovoltaic Devices
A description is not available for this item.

References

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