NASA-LLIS-0316
Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit
active, Most Current
| Organization: | NASA |
| Publication Date: | 3 August 1993 |
| Status: | active |
| Page Count: | 2 |
scope:
Description of Driving Event:
In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted.
Document History
NASA-LLIS-0316
August 3, 1993
Lessons Learned – Connector Savers, Bent Pins, Open or Short Circuit
Description of Driving Event:
In ECLSS Flight Experiment (EFE) testing, damage to the pins in electrical connectors occurred as a result of excessive mating/demating. Schedule delays resulted.
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