NASA-LLIS-1803
Lessons Learned – CSAM Augments X-Ray Inspection of Die Attach (MRO Ka-Band Anomaly)
| Organization: | NASA |
| Publication Date: | 31 July 2007 |
| Status: | active |
| Page Count: | 5 |
scope:
Abstract:
An in-flight failure of a hybrid amplifier used to derive the Ka-band downlink signal for Mars Reconnaissance Orbiter suggests that X-ray screening alone may not be adequate to determine the quality of coverage of the eutectic die attach. CSAM is a non-destructive internal inspection technique that can complement high resolution X-rays by isolating variations in material properties. When screening RF hybrids and other critical components, consider the use of CSAM to augment high resolution X-ray inspection.
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