NASA-LLIS-0924
Lessons Learned – Tin Whiskers Cause Electrical Shorts
active, Most Current
| Organization: | NASA |
| Publication Date: | 16 November 2000 |
| Status: | active |
| Page Count: | 4 |
scope:
Abstract:
Although the phenomenon of tin whisker formation is well known, spacecraft are still suffering failures from them. When tin plating is used on mechanical, electrical or electromechanical components, continuous process monitoring (especially of suppliers) must occur to assure that tin whisker growth is addressed including control of the type and amount of impurities added to plating baths and compliance is maintained.
Document History
NASA-LLIS-0924
November 16, 2000
Lessons Learned – Tin Whiskers Cause Electrical Shorts
Abstract:
Although the phenomenon of tin whisker formation is well known, spacecraft are still suffering failures from them. When tin plating is used on mechanical, electrical or electromechanical...
References
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