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ASTM D3380

Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates

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Organization: ASTM
Publication Date: 1 January 2010
Status: inactive
Page Count: 13
scope:

This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).

This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats, glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen thickness of 116 in. (1.6 mm). The materials listed in the preceding sentence have been used in commercial applications at nominal frequency of 9.6 GHz.

NOTE 1-See Appendix X1 for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6 GHz.

The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

*A Summary of Changes section appears at the end of this standard.

Document History

November 1, 2014
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz)....
ASTM D3380
January 1, 2010
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz)....
February 23, 1990
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz)....
January 1, 1990
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
1. Scope 1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to...
February 24, 1989
STANDARD TEST METHOD FOR RELATIVE PERMITTIVITY (DIELECTRIC CONSTANT) AND DISSIPATION FACTOR OF POLYMER-BASED MICROWAVE CIRCUIT SUBSTRATES
A description is not available for this item.
January 29, 1982
STANDARD TEST METHOD FOR PERMITTIVITY (DIELECTRIC CONSTANT) AND DISSIPATION FACTOR OF PLASTIC-BASED MICROWAVE CIRCUIT SUBSTRATES
A description is not available for this item.

References

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