NASA-LLIS-0800
Lessons Learned – Thick Dielectric Charging/Internal Electrostatic Discharge (IESD)
| Organization: | NASA |
| Publication Date: | 17 April 2000 |
| Status: | active |
| Page Count: | 4 |
scope:
Practice:
Dielectric compositions used in such spacecraft materials as circuit boards, cable insulation and thermal blankets will build up an imbedded charge when exposed to a natural space environment featuring energetic electrons. If the electric field resulting from the imbedded charge exceeds the breakdown threshold for the dielectric, an arc will occur, damaging the dielectric and producing an electromagnetic pulse which can couple into subsystem electronics.
Enhance hardware reliability in an energetic electron environment by conducting a materials inventory, resistivity analysis, and shielding assessment. Ascertain material susceptibility to deep dielectric charging and explosive discharge when the material:
1. Is exposed to an energetic electron flux exceeding 2x105 electrons/(cm2 -s), and
2. Achieves an imbedded charge density greater than a threshold of 1011 electrons/cm2.
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