IEC 62416
Semiconductor devices – Hot carrier test on MOS transistors
active, Most Current
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| Organization: | IEC |
| Publication Date: | 1 April 2010 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Document History
IEC 62416
April 1, 2010
Semiconductor devices – Hot carrier test on MOS transistors
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required...