IEC 62415
Semiconductor devices – Constant current electromigration test
active, Most Current
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| Organization: | IEC |
| Publication Date: | 1 May 2010 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Document History
IEC 62415
May 1, 2010
Semiconductor devices – Constant current electromigration test
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.