CENELEC - EN 62415
Semiconductor devices - Constant current electromigration test
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 June 2010 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Document History
EN 62415
June 1, 2010
Semiconductor devices - Constant current electromigration test
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.